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Variable-Pressure Scanning Electron Microscope (VP-SEM)
Hitachi S-3000N variable-pressure SEM is an advanced electron microscopic imaging system with the capability of using high vacuum or a variable pressure range from 1-270 Pa. This SEM uses a Windows-XP-based computerized operating system with high-resolution digital processing capacity and is most suitable for topographic analysis using biological or geological samples.
Magnification range: 25x to 200,000x; Resolution: up to 3 nm in high vacuum mode and up to 5 nm in variable pressure mode
